tQdrDzmTmM-9_33mxTtzHfTRMxACHjrv32zc5qSygYI

GOS No. 515 – SiC Wafer Surface Texture Measurement
SiC Wafer (100x)

Title SiC Wafer (100x)
Date September 8, 2025
Pseudo-color Rainbow Scale
Measurement
System
OptoNume® SN500 series
Interference
Objective Lens
Nikon CF IC EPI Plan DI 100x
Field of View 112 μm x 112 μm
Averaging 12
Display
Range
-0.5 to 2 nm
Sa 0.047 nm

Technical Document Preview

By registering as a paid member for an annual fee of ¥11,000, you can download all measurement reports without limitation.
Please note that membership will not be automatically renewed.
To register, click SIGN UP at the top of this page.
If you are already a registered member, please click the button above to start downloading the report.