We are pleased to announce that OptoNume SN507 will be exhibited at the Japan Inspection Instruments Manufacturers’ Show 2026, which will be held at Tokyo Big Sight from September 16 to 18, 2026.
You are warmly invited to visit the Chuo Precision Industrial Co., Ltd. booth (Booth J-50, East 1 Exhibition Hall), where the OptoNume SN507 system will be on display.
During the exhibition, we will perform live demonstrations of surface topography inspection of silicon wafers, showcasing the outstanding measurement capabilities of the OptoNume system.
We are also proud to note that every measurement example currently published in the Gallery of Surfaces (GOS) has been acquired using the OptoNume SN507 system. The live demonstrations will provide an excellent opportunity to experience firsthand the high accuracy, high repeatability, and exceptional imaging performance demonstrated throughout GOS.
We look forward to welcoming you to our booth and hope you will take this opportunity to discover the capabilities of OptoNume SN507.
